LISCIO, A. Electronic characterization of bulk hetero-junctions by Kelvin Probe Force Microscopies. Microscopie, [S. l.], v. 21, n. 1, p. 31–32, 2014. DOI: 10.4081/microscopie.2014.5000. Disponível em: https://www.pagepressjournals.org/microscopie/article/view/5000. Acesso em: 22 nov. 2024.