A new method for simultaneous Shear Force and Radiofrequency-Microwave analysis in Scanning Probe Microscopy: morphological, viscoelastic and dielectric properties of materials
https://doi.org/10.4081/microscopie.2014.5007
Submitted: 16 January 2015
Accepted: 16 January 2015
Published: 31 March 2014
Accepted: 16 January 2015
Abstract Views: 926
PDF: 913
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All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.
Valdrè, G., & Moro, D. (2014). A new method for simultaneous Shear Force and Radiofrequency-Microwave analysis in Scanning Probe Microscopy: morphological, viscoelastic and dielectric properties of materials. Microscopie, 21(1), 45–46. https://doi.org/10.4081/microscopie.2014.5007
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