V.V., A. Proceedings of the SISM Workshop "Application of electron microscopy in cultural heritage studies", Urbino, 28-29 September 2015. Microscopie, [S. l.], v. 25, n. 1, p. 25–48, 2016. DOI: 10.4081/microscopie.2016.5918. Disponível em: https://www.pagepressjournals.org/microscopie/article/view/5918. Acesso em: 19 apr. 2024.