3° Corso di Microscopia elettronica e confocale in ambito botanico


Published: 2 April 2020
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Authors

Relazione di Massimo Tonelli sul corso SISM tenuto a Modena il 2-3 dicembre 2019.


Tonelli, M. (2020). 3° Corso di Microscopia elettronica e confocale in ambito botanico. Microscopie, 31(1). https://doi.org/10.4081/microscopie.2020.8926

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