Electronic characterization of bulk hetero-junctions by Kelvin Probe Force Microscopies
https://doi.org/10.4081/microscopie.2014.5000
Submitted: 16 January 2015
Accepted: 16 January 2015
Published: 31 March 2014
Accepted: 16 January 2015
Abstract Views: 607
PDF: 1019
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All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.
Liscio, A. (2014). Electronic characterization of bulk hetero-junctions by Kelvin Probe Force Microscopies. Microscopie, 21(1), 31–32. https://doi.org/10.4081/microscopie.2014.5000
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